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PostHeaderIcon Recover Chip EPM7064AETC100-4N Software

Recover Chip EPM7064AETC100-4N Software

Recover Chip EPM7064AETC100-4N Software

We can recover Chip EPM7064AETC100-4N software, please view below Chip EPM7064AETC100-4N features for your reference:

High-performance 3.3-V EEPROM-based programmable logic devices (PLDs) built on second-generation Multiple Array MatriX

3.3-V in-system programmability (ISP) through the built-in IEEE Std. 1149.1 Joint Test Action Group (JTAG) interface with advanced pin-locking capability

 

– MAX 7000AE device in-system programmability (ISP) circuitry compliant with IEEE Std. 1532

– EPM7128A and EPM7256A device ISP circuitry compatible with IEEE Std. 1532

 

Built-in boundary-scan test (BST) circuitry compliant with IEEE Std. 1149.1

Supports JEDEC Jam Standard Test and Programming Language (STAPL) JESD-71

Enhanced ISP features

– Enhanced ISP algorithm for faster programming (excluding EPM7128A and EPM7256A devices)

– ISP_Done bit to ensure complete programming (excluding EPM7128A and EPM7256A devices)

– Pull-up resistor on I/O pins during in-system

– Pin-compatible with the popular

4.5-ns pin-to-pin logic delays with counter frequencies of up to 227.3 MHz

MultiVoltTM I/O interface enables device core to run at 3.3 V, while I/O pins are compatible with 5.0-V, 3.3-V, and 2.5-V logic levels Pin counts ranging from 44 to 256 in a variety of thin quad flat pack (TQFP), plastic quad flat pack (PQFP), ball-grid array (BGA), space-saving FineLine BGATM, and plastic J-lead chip carrier (PLCC) packages.

Supports hot-socketing in MAX 7000AE devices

Programmable interconnect array (PIA) continuous routing structure for fast, predictable performance

PCI-compatible

Bus-friendly architecture, including programmable slew-rate control

Open-drain output option

Programmable macrocell registers with individual clear, preset, clock, and clock enable controls

Programmable power-up states for macrocell registers in MAX 7000AE devices

Programmable power-saving mode for 50% or greater power reduction in each macrocell

Configurable expander product-term distribution, allowing up to 32 product terms per macrocell

Programmable security bit for protection of proprietary designs 6 to 10 pin- or logic-driven output enable signals

Two global clock signals with optional inversion

Enhanced interconnect resources for improved routability

Fast input setup times provided by a dedicated path from I/O pin to macrocell registers

Programmable output slew-rate control

Programmable ground pins

Software design support and automatic place-and-route provided by Altera’s development systems for Windows-based PCs and Sun SPARCstation, and HP 9000 Series 700/800 workstations Additional design entry and simulation support provided by EDIF 2 0 0 and 3 0 0 netlist files, library of parameterized modules (LPM), Verilog HDL, VHDL, and other interfaces to popular EDA tools from manufacturers such as Cadence, Exemplar Logic, Mentor Graphics, OrCAD, Synopsys, Synplicity, and VeriBest

Programming support with Altera’s Master Programming Unit (MPU), MasterBlasterTM serial/universal serial bus (USB) communications cable, ByteBlasterMVTM parallel port download cable, and BitBlasterTM serial download cable, as well as programming hardware from third-party manufacturers and any JamTM STAPL File (.jam), Jam Byte-Code File (.jbc), or Serial Vector Format File- (.svf) capable in-circuit tester.