Secured Microcontroller STM8S207K8T6 Flash Heximal Code Unlocking will be able to reset the MCU status and readout software from stm8s207k8 program flash memory directly, the fuse bit of processor’s stm8s207k8 will be cracked by focus ion beam;
Susceptibility tests are performed on a sample basis during product characterization.
Functional EMS (electromagnetic susceptibility)
While executing a simple application (toggling 2 LEDs through I/O ports), the product is stressed by two electromagnetic events until a failure occurs (indicated by the LEDs).
ESD: Electrostatic discharge (positive and negative) is applied on all pins of the device until a functional disturbance occurs. This test conforms with the IEC 61000-4-2 standard.
güvenli mikrodenetleyici STM8S207K8T6 flaş onaltılık kod kilidini açma, MCU durumunu sıfırlayabilecek ve yazılımı doğrudan stm8s207k8 program flash belleğinden okuyabilecek, işlemcinin stm8s207k8’inin sigorta biti odak iyon ışını ile kırılacaktır;
FTB: A burst of fast transient voltage (positive and negative) is applied to VDD and VSS through a 100 pF capacitor, until a functional disturbance occurs. This test conforms with the IEC 61000-4-4 standard which is an important fact for reversing stm8s005 mcu flash memory code.
A device reset allows normal operations to be resumed. The test results are given in the table below based on the EMS levels and classes defined in application note AN1709 (EMC design guide for STM microcontrollers).
Designing hardened software to avoid noise problems
EMC characterization and optimization are performed at component level with a typical application environment and simplified MCU software. It should be noted that good EMC performance is highly dependent on the user application and the software in particular by recovering stm8s005k6 microcontroller data eeprom content.
Therefore it is recommended that the user applies EMC software optimization and prequalification tests in relation with the EMC level requested for his application.