Texas Instruments MSP430G2313 Microprocessor Breaking
Texas Instruments MSP430G2313 Microprocessor Breaking refers to unlock the protection over msp430g2313 flash memory and eeprom memory, and then extract embedded code from mcu msp430g2313;
JTAG FUSE
over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted)
PARAMETER | TEST CONDITIONS | MIN | MAX | UNIT | |
VCC(FB) | Supply voltage during fuse-blow condition | TA = 25°C | 2.5 | V | |
VFB | Voltage level on TEST for fuse blow | 6 | 7 | V | |
IFB | Supply current into TEST during fuse blow | 100 | mA | ||
tFB | Time to blow fuse | 1 | ms |
(1) Once the fuse is blown, no further access to the JTAG/Test, Spy-Bi-Wire, and emulation feature is possible, and JTAG is switched to bypass mode.
Calibration data is stored for both the DCO and for ADC10 organized in a tag-length-value structure by replicate msp430g2152 flash memory data.
Table 10. Tags Used by the ADC Calibration Tags
NAME | ADDRESS | VALUE | DESCRIPTION |
TAG_DCO_30 | 0x10F6 | 0x01 | DCO frequency calibration at VCC = 3 V and TA = 30°C at calibration |
TAG_ADC10_1 | 0x10DA | 0x10 | ADC10_1 calibration tag |
TAG_EMPTY | – | 0xFE | Identifier for empty memory areas |
Texas Instruments MSP430G2213 Microcontroller Memory Reverse Engineering
Texas Instruments MSP430G2213 Microcontroller Memory Reverse Engineering technique will help to locate the security fuse bit of mcu msp430g2213 and crack it by focus ion beam, and then extract embedded heximal program out from msp430g2213 mcu;
RAM
over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted)
PARAMETER | TEST CONDITIONS | MIN MAX | UNIT |
V(RAMh) RAM retention supply voltage (1) | CPU halted | 1.6 | V |
(1) This parameter defines the minimum supply voltage VCC when the data in RAM remains unchanged which can be used for restoring msp430g2001 heximal program. No program execution should happen during this supply voltage condition.
JTAG and Spy-Bi-Wire Interface
over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted)
PARAMETER | TEST CONDITIONS | VCC | MIN | TYP | MAX | UNIT | ||
fSBW | Spy-Bi-Wire input frequency | 2.2 V | 0 | 20 | MHz | |||
tSBW,Low | Spy-Bi-Wire low clock pulse duration | 2.2 V | 0.025 15 | µs | ||||
tSBW,En | Spy-Bi-Wire enable time (TEST high to acceptance of first clock edge | (1)) | 2.2 V | 1 | µs | |||
tSBW,Ret | Spy-Bi-Wire return to normal operation time | 2.2 V | 15 | 100 | µs | |||
fTCK | TCK input frequency(2) | 2.2 V | 0 | 5 | MHz | |||
RInternal | Internal pulldown resistance on TEST | 2.2 V | 25 | 60 | 90 | kΩ |
Altera Programmable Logic Device EPM7128BUC169 Firmware Restoration
Altera Programmable Logic Device EPM7128BUC169 Firmware Restoration means the embedded eeprom memory inside original PLD EPM7128BUC processor will be unlocked and firmware can be fully extracted from IC CPLD;
All MAX 7000A devices contain a programmable security bit that controls access to the data programmed into the device. When this bit is programmed, a design implemented in the device cannot be copied or retrieved.
This feature provides a high level of design security because programmed data within EEPROM cells is invisible. The security bit that controls this function, as well as all other programmed data, is reset only when the device is reprogrammed after reverse engineering cpld epm7032aeti44 memory.
MAX 7000A devices are fully tested. Complete testing of each
programmable EEPROM bit and all internal logic elements ensures 100% programming yield. AC test measurements are taken under conditions equivalent to those shown. Test patterns can be used and then erased during early stages of the production flow when recover cpld epm7128 embedded eeprom program.
Altera CPLD EPM7128ALC Embedded Eeprom Program Recovery
Altera CPLD EPM7128ALC Embedded Eeprom Program Recovery is a process to unlock security fuse bit of EPM7128 CPLD chip and extract eeprom firmware from CPLD’s secured memory in the format of JED;
Because MAX 7000A devices can be used in a mixed-voltage environment, they have been designed specifically to tolerate any possible power-up sequence. The VCCIO and VCCINT power planes can be powered in any order.
Signals can be driven into MAX 7000AE devices before and during power- up (and power-down) without damaging the device.
Additionally, MAX 7000AE devices do not drive out during power-up when breaking altera cpld epm7064aetc protection. Once operating conditions are reached, MAX 7000AE devices operate as specified by the user.
MAX 7000AE device I/O pins will not source or sink more than 300 µA of DC current during power-up. All pins can be driven up to 5.75 V during hot-socketing, except the OE1 and GLCRn pins.
The OE1 and GLCRn pins can be driven up to 3.6 V during hot-socketing. After VCCINT and VCCIO reach the recommended operating conditions, these two pins are 5.0-V tolerant which can be used for recover embedded eeprom firmware of EPM7032VTC cpld chipset.
EPM7128A and EPM7256A devices do not support hot-socketing and may drive out during power-up.
Altera PLD EPM7128ALC84 IC Breaking
Altera PLD EPM7128ALC84 IC Breaking involve the unlocking of epm7128 eeprom memory tamper resistance system and extract embedded jed software from pld eeprom memory;
MAX 7000S devices
– ISP circuitry compatible with IEEE Std. 1532
Includes 5.0-V MAX 7000 devices and 5.0-V ISP-based MAX 7000S devices
Built-in JTAG boundary-scan test (BST) circuitry in MAX 7000S devices with 128 or more macrocells
Complete EPLD family with logic densities ranging from 600 to 5,000 usable gates (see Tables 1 and 2) 5-ns pin-to-pin logic delays with up to 175.4-MHz counter frequencies (including interconnect)
PCI-compliant devices available
Open-drain output option in MAX 7000S devices
Programmable macrocell flipflops with individual clear, preset, clock, and clock enable controls
Programmable power-saving mode for a reduction of over 50% in each macrocell
Configurable expander product-term distribution, allowing up to 32 product terms per macrocell 44 to 208 pins available in plastic J-lead chip carrier (PLCC), ceramic pin-grid array (PGA), plastic quad flat pack (PQFP), power quad flat pack (RQFP), and 1.0-mm thin quad flat pack (TQFP) packages Programmable security bit for protection of proprietary designs 3.3-V or 5.0-V operation.
– MultiVoltTM I/O interface operation, allowing devices to interface with 3.3-V or 5.0-V devices (MultiVolt I/O operation is not available in 44-pin packages)
– Pin compatible with low-voltage MAX 7000A and MAX 7000B devices
Enhanced features available in MAX 7000E and MAX 7000S devices
– Six pin- or logic-driven output enable signals
– Two global clock signals with optional inversion
– Enhanced interconnect resources for improved routability
– Fast input setup times provided by a dedicated path from I/O pin to macrocell registers
– Programmable output slew-rate control
Software design support and automatic place-and-route provided by Altera’s development system for Windows-based PCs and Sun SPARCstation, and HP 9000 Series 700/800 workstations Additional design entry and simulation support provided by EDIF 2 0 0 and 3 0 0 netlist files, library of parameterized modules (LPM) when attacking cpld altera epm7064stc eeprom memory,
Verilog HDL, VHDL, and other interfaces to popular EDA tools from manufacturers such as Cadence, Exemplar Logic, Mentor Graphics, OrCAD, Synopsys, and VeriBest
Programming support
– Altera’s Master Programming Unit (MPU) and programming hardware from third-party manufacturers program all MAX 7000 devices
– The BitBlasterTM serial download cable, ByteBlasterMVTM parallel port download cable, and MasterBlasterTM serial/universal serial bus (USB) download cable program MAX 7000S devices
Attack Altera CPLD EPM7064STC44-10 IC Eeprom Memory
Attack Altera CPLD EPM7064STC44-10 IC Eeprom Memory needs to crack altera cpld epm7064 fuse bit and extract embedded jed file from eeprom memory;
MAX 7000A devices provide an optional open-drain (equivalent to open-collector) output for each I/O pin. This open-drain output enables the device to provide system-level control signals to recovering cpld epm7032vtc eeprom code (e.g., interrupt and write enable signals) that can be asserted by any of several devices. This output can also provide an additional wired-OR plane.
Open-drain output pins on MAX 7000A devices (with a pull-up resistor to the 5.0-V supply) can drive 5.0-V CMOS input pins that require a high VIH. When the open-drain pin is active, it will drive low. When the pin is inactive, the resistor will pull up the trace to 5.0 V to meet CMOS VOH requirements.
The open-drain pin will only drive low or tri-state; it will never drive high. The rise time is dependent on the value of the pull-up resistor and load impedance by reversing cpld epm7032aeti44 eeprom jed file. The IOL current specification should be considered when selecting a pull-up resistor.
Altera CPLD EPM7064AETC100 Chip Protection Breaking
Altera CPLD EPM7064AETC100 Chip Protection Breaking needs to unlock epm7064aetc100 security fuse bit by focus ion beam and then copy embedded firmware from eeprom memory of cpld chip;
Bus-friendly architecture, including programmable slew-rate control
Open-drain output option
Programmable macrocell registers with individual clear, preset, clock, and clock enable controls
Programmable power-up states for macrocell registers in MAX 7000AE devices
Programmable power-saving mode for 50% or greater power reduction in each macrocell
Configurable expander product-term distribution, allowing up to 32 product terms per macrocell
Programmable security bit for protection of proprietary designs 6 to 10 pin- or logic-driven output enable signals
Two global clock signals with optional inversion
Enhanced interconnect resources for improved routability
Fast input setup times provided by a dedicated path from I/O pin to macrocell registers
Programmable output slew-rate control from Crack PLD IC Altera EPM7064AETC100-4N
Programmable ground pins
Software design support and automatic place-and-route provided by Altera’s development systems for Windows-based PCs and Sun SPARCstation, and HP 9000 Series 700/800 workstations Additional design entry and simulation support provided by EDIF 2 0 0 and 3 0 0 netlist files, library of parameterized modules (LPM), Verilog HDL, VHDL, and other interfaces to popular EDA tools from manufacturers such as Cadence, Exemplar Logic, Mentor Graphics, OrCAD, Synopsys, Synplicity, and VeriBest.
Programming support with Altera’s Master Programming Unit (MPU), MasterBlasterTM serial/universal serial bus (USB) communications cable, ByteBlasterMVTM parallel port download cable, and BitBlasterTM serial download cable, as well as programming hardware from third-party manufacturers and any JamTM STAPL File (.jam), Jam Byte-Code File (.jbc), or Serial Vector Format File (.svf) capable in-circuit tester when recover altera cpld epm7064aetc100 software.
Reverse Engineering INTEL CPLD EPM7032AELC44-10N Chipset
Reverse Engineering INTEL CPLD EPM7032AELC44-10N Chipset can help engineer learn the internal structure of CPLD and unlock cpld epm7032 cpld through locating the fuse bit and disable it by focus ion beam, then the embedded jed file will be extracted from its eeprom directly;
High-performance 3.3-V EEPROM-based programmable logic devices (PLDs) built on second-generation Multiple Array MatriX (MAX®) architecture (see Table 1)
- 3.3-V in-system programmability (ISP) through the built-in IEEE Std. 1149.1 Joint Test Action Group (JTAG) interface with advanced pin-locking capability to reverse cpld epm7032aeti44 jed file
- MAX 7000AE device in-system programmability (ISP) circuitry compliant with IEEE Std. 1532
- EPM7128A and EPM7256A device ISP circuitry compatible with IEEE Std. 1532
- Built-in boundary-scan test (BST) circuitry compliant with IEEE Std. 1149.1
- Supports JEDEC Jam Standard Test and Programming Language (STAPL) JESD-71
- Enhanced ISP features
- Enhanced ISP algorithm for faster programming (excluding EPM7128A and EPM7256A devices)
- ISP_Done bit to ensure complete programming (excluding EPM7128A and EPM7256A devices)
-
- Pull-up resistor on I/O pins during in-system programming
- Pin-compatible with the popular 5.0-V MAX 7000S devices
- High-density PLDs ranging from 600 to 10,000 usable gates
- Extended temperature range
Recovering Altera CPLD EPM7032VTC44-15 Chipset Protection System
Recovering Altera CPLD EPM7032VTC44-15 Chipset Protection System is a process to crack altera cpld epm7032vtc44 security fuse bit and then copy embedded firmware out from its cpld flash memory;
4.5-ns pin-to-pin logic delays with counter frequencies of up to 227.3 MHz
MultiVoltTM I/O interface enables device core to run at 3.3 V, while I/O pins are compatible with 5.0-V, 3.3-V, and 2.5-V logic levels;
Pin counts ranging from 44 to 256 in a variety of thin quad flat pack (TQFP), plastic quad flat pack (PQFP), ball-grid array (BGA), space- saving FineLine BGATM, and plastic J-lead chip carrier (PLCC) packages;
Supports hot-socketing in MAX 7000AE devices
Programmable interconnect array (PIA) continuous routing structure for fast, predictable performance
PCI-compatible
Bus-friendly architecture, including programmable slew-rate control
Open-drain output option
Programmable macrocell registers with individual clear, preset, clock, and clock enable controls
Programmable power-up states for macrocell registers in MAX 7000AE devices
Programmable power-saving mode for 50% or greater power reduction in each macrocell
Configurable expander product-term distribution, allowing up to 32 product terms per macrocell
Programmable security bit for protection of proprietary designs which can be used to attack cpld chip encrypted code
6 to 10 pin- or logic-driven output enable signals
Two global clock signals with optional inversion
Enhanced interconnect resources for improved routability
Fast input setup times provided by a dedicated path from I/O pin to macrocell registers
Programmable output slew-rate control
Programmable ground pins which can be used to copy lattice cpld program file
Reverse CPLD IC EPM7032AETI44-7 Eeprom JED File
Reverse CPLD IC EPM7032AETI44-7 Eeprom JED File starts from unlocking the security fuse bit of cpld epm7032aeti44 chip, the embedded jed file will be extracted from cpld chip;
Each LAB has 16 shareable expanders that can be viewed as a pool of uncommitted single product terms (one from each macrocell) with inverted outputs that feed back into the logic array.
Each shareable expander can be used and shared by any or all macrocells in the LAB to build complex logic functions when reading cpld dump information. A small delay (tSEXP) is incurred when shareable expanders are used. Figure 3 shows how shareable expanders can feed multiple macrocells.
Parallel expanders are unused product terms that can be allocated to a neighboring macrocell to implement fast, complex logic functions.
Parallel expanders allow up to 20 product terms to directly feed the macrocell OR logic, with five product terms provided by the macrocell and 15 parallel expanders provided by neighboring macrocells in the LAB.
The compiler can allocate up to three sets of up to five parallel expanders to the macrocells that require additional product terms when attacking cpld encrypted code. Each set of five parallel expanders incurs a small, incremental timing delay (tPEXP).
For example, if a macrocell requires 14 product terms, the compiler uses the five dedicated product terms within the macrocell and allocates two sets of parallel expanders; the first set includes five product terms, and the second set includes four product terms, increasing the total delay by 2 ´ tPEXP.