PostHeaderIcon NXP Locked Microcontroller SPC5604PGF1VLQ6 Flash Data Duplication

NXP Locked Microcontroller SPC5604PGF1VLQ6 Flash Data Duplication needs to crack spc5604pgf1vl mcu protective system and extract embedded flash binary from microcomputer’s memory:

NXP Locked Microcontroller SPC5604PGF1VLQ6 Flash Data Duplication needs to crack spc5604pgf1vl mcu protective system and extract embedded flash binary from microcomputer's memory
NXP Locked Microcontroller SPC5604PGF1VLQ6 Flash Data Duplication needs to crack spc5604pgf1vl mcu protective system and extract embedded flash binary from microcomputer’s memory

In fact a current sink contributor is represented by the charge sharing effects with the sampling capacitance: being CS and Cp2 substantially two switched capacitances, with a frequency equal to the conversion rate of the ADC, it can be seen as a resistive path to ground when recover spc5603bk microcomputer flash file.

For instance, assuming a conversion rate of 1 MHz, with CS+Cp2 equal to 3 pF, a resistance of 330 kW is obtained (REQ = 1 / (fc × (CS+Cp2)), where fc represents the conversion rate at the considered channel). To minimize the error induced by the voltage partitioning between this resistance (sampled voltage on CS+Cp2) and the sum of RS + RF, the external circuit must be designed to respect the below Equation:

Input equivalent circuit (precise channels)
Input equivalent circuit (precise channels)

A second aspect involving the capacitance network shall be considered. Assuming the three capacitances CF, CP1 and CP2 are initially charged at the source voltage VA (refer to the equivalent circuit in Figure 13): A charge sharing phenomenon is installed when the sampling phase is started (A/D switch close).

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