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Unless otherwise specified, the minimum and maximum values are guaranteed in the worst conditions of ambient temperature, supply voltage and frequencies by tests in production on 100% of the devices with an ambient temperature at TA = 25 °C and TA = TAmax (given by the selected temperature range).
Data based on characterization results, design simulation and/or technology characteristics are indicated in the table footnotes and are not tested in production to break stm32f301k6 encrypted microprocessor flash memory. Based on characterization, the minimum and maximum values refer to sample tests and represent the mean value plus or minus three times the standard deviation (mean±3s).
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Unless otherwise specified, typical data are based on TA = 25 °C, VDD = VDDA = 3.3 V. They are given only as design guidelines and are not tested. Typical ADC accuracy values are determined by characterization of a batch of samples from a standard diffusion lot over the full temperature range when restoring secured stm32f301r8 mcu flash firmware, where 95% of the devices have an error less than or equal to the value indicated (mean±2s).