Attack Chip dsPIC33FJ256GP506A Software
Attack Chip dsPIC33FJ256GP506A and compromise Microcontroller dsPIC33FJ256GP506 tamper resistance system, readout MCU software from dsPIC33FJ256 flash and eeprom memory;
Operating Conditions
· 3.0V to 3.6V, -40ºC to +150ºC, DC to 20 MIPS
· 3.0V to 3.6V, -40ºC to +125ºC, DC to 40 MIPS
Core: 16-bit dsPIC33F CPU
Timers/Output Compare/Input Capture
· Up to nine 16-bit timers/counters. Can pair up to make four 32-bit timers;
· Eight Output Compare modules configurable as timers/counters;
Code-efficient (C and Assembly) architecture
Two 40-bit wide accumulators
Single-cycle (MAC/MPY) with dual data fetch
Single-cycle mixed-sign MUL plus hardware divide
· Eight Input Capture modules
Communication Interfaces
· Two UART modules (10 Mbps)
– With support for LIN 2.0 protocols and IrDA®
· Two 4-wire SPI modules (15 Mbps)
Clock Management
· Up to two I2C™ modules (up to 1 Mbaud) with ±2% internal oscillator
Programmable PLLs and oscillator clock sources
Fail-Safe Clock Monitor (FSCM)
Independent Watchdog Timer (WDT)
Fast wake-up and start-up
SMBus support
· Up to two Enhanced CAN (ECAN) modules (1 Mbaud) with 2.0B support
· Data Converter Interface (DCI) module with I2S codec support
Power Management
· Low-power management modes (Sleep, Idle, Doze)
· Integrated Power-on Reset and Brown-out Reset
· 2.1 mA/MHz dynamic current (typical)
· 50 μA IPD current (typical)
Advanced Analog Features
· Two ADC modules:
– Configurable as 10-bit, 1.1 Msps with four S&H or 12-bit, 500 ksps with one S&H
– 18 analog inputs on 64-pin devices and up to 32 analog inputs on 100-pin devices
· Flexible and independent ADC trigger sources
Input/Output
· Sink/Source up to 10 mA (pin specific) for standard VOH/VOL, up to 16 mA (pin specific) for non-standard VOH1
· 5V-tolerant pins
· Selectable open drain, pull-ups, and pull-downs
· Up to 5 mA overvoltage clamp current
· External interrupts on all I/O pins
Qualification and Class B Support
· AEC-Q100 REVG (Grade 1 -40ºC to +125ºC)
· AEC-Q100 REVG (Grade 0 -40ºC to +150ºC)
· Class B Safety Library, IEC 60730
Debugger Development Support
Packages
In-circuit and in-application programming
Two program and two complex data breakpoints
IEEE 1149.2-compatible (JTAG) boundary scan
Trace and run-time watch